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1

Effects of interfacial NH3/N2O-plasma treatment on the structural and electrical properties of ultra-thin HfO2 gate dielectrics on p-Si substrates

S. Maikap, Je-Hun Lee, R. Mahapatra, Samik Pal, Y.S. No, Won-Kook Choi, S.K. Ray, Doh-Y. Kim

Journal:

Solid-State Electronics

Year:

2005

Language:

english

File:

PDF, 386 KB

english, 2005

2

Experimental confirmation of charged carbon clusters in the hot filament diamond reactor

Jn.-D Jeon, Chang J Park, Doh-Y Kim, Nong M Hwang

Journal:

Journal of Crystal Growth

Year:

2000

Language:

english

File:

PDF, 108 KB

english, 2000

3

Deposition mechanism of gold by thermal evaporation: approach by charged cluster model

Mark C Barnes, Doh-Y Kim, Hyo S Ahn, Chang O Lee, Nong M Hwang

Journal:

Journal of Crystal Growth

Year:

2000

Language:

english

File:

PDF, 1.75 MB

english, 2000

4

Effect of substrates on morphological evolution of a film in the silicon CVD process: approach by charged cluster model

Woo S Cheong, Duk Y Yoon, Doh-Y Kim, Nong M Hwang

Journal:

Journal of Crystal Growth

Year:

2000

Language:

english

File:

PDF, 822 KB

english, 2000

5

Growth of silicon nanowires by chemical vapor deposition: approach by charged cluster model

Nong M Hwang, Woo S Cheong, Duk Y Yoon, Doh-Y Kim

Journal:

Journal of Crystal Growth

Year:

2000

Language:

english

File:

PDF, 939 KB

english, 2000

6

Low-pressure synthesis of diamond without hydrogen: approach by charged cluster model

Nong M Hwang, Doh-Y Kim

Journal:

Journal of Crystal Growth

Year:

2000

Language:

english

File:

PDF, 79 KB

english, 2000

7

Effect of methane concentration on size of charged clusters in the hot filament diamond CVD process

In-D. Jeon, Chang J. Park, Doh-Y. Kim, Nong M. Hwang

Journal:

Journal of Crystal Growth

Year:

2001

Language:

english

File:

PDF, 223 KB

english, 2001

8

Observation of carbon clusters of a few nanometers in the oxyacetylene diamond CVD process

Hyo-S. Ahn, Hyun-M. Park, Doh-Y. Kim, Nong M. Hwang

Journal:

Journal of Crystal Growth

Year:

2002

Language:

english

File:

PDF, 323 KB

english, 2002

9

Spontaneous generation of charged clusters of a few nanometers during thermal evaporation of copper

Beom S. Lee, Mark C. Barnes, Doh-Y. Kim, Nong M. Hwang

Journal:

Journal of Crystal Growth

Year:

2002

Language:

english

File:

PDF, 145 KB

english, 2002

10

Generation of charged clusters during thermal evaporation of gold

Mark C Barnes, In-D Jeon, Doh-Y Kim, Nong M Hwang

Journal:

Journal of Crystal Growth

Year:

2002

Language:

english

File:

PDF, 316 KB

english, 2002

11

Origin of positive charging of nanometer-sized clusters generated during thermal evaporation of copper

In-D Jeon, M.C Barnes, Doh-Y Kim, Nong M Hwang

Journal:

Journal of Crystal Growth

Year:

2003

Language:

english

File:

PDF, 398 KB

english, 2003

12

Detection of large cluster ions by time-of-flight mass spectrometry with a conversion dynode

In-D. Jeon, C.J. Park, Nong M. Hwang, Doh-Y. Kim

Journal:

Microchemical Journal

Year:

2001

Language:

english

File:

PDF, 158 KB

english, 2001

13

Effect of Grain Shape on Abnormal Grain Growth in Liquid-Phase-Sintered Nb1−xTixC–Co Alloys

Kyoon Choi, Nong M. Hwang, Doh-Y. Kim

Journal:

Journal of the American Ceramic Society

Year:

2002

Language:

english

File:

PDF, 3.11 MB

english, 2002

14

Abnormal grain growth by solid-state wetting along grain boundary or triple junction

Nong M. Hwang, Sung B. Lee, Doh-Y. Kim

Journal:

Scripta Materialia

Year:

2001

Language:

english

File:

PDF, 766 KB

english, 2001

15

Characteristics of ultrathin HfO[sub 2] gate dielectrics on strained-Si[sub 0.74]Ge[sub 0.26] layers

Lee, Je-Hun, Maikap, S., Kim, Doh-Y., Mahapatra, R., Ray, S. K., No, Y. S., Choi, Won-Kook

Journal:

Applied Physics Letters

Year:

2003

Language:

english

File:

PDF, 517 KB

english, 2003

16

Structural and electrical characteristics of the interfacial layer of ultrathin ZrO[sub 2] films on partially strain compensated Si[sub 0.69]Ge[sub 0.3]C[sub 0.01] layers

Mahapatra, R., Maikap, S., Lee, Je-Hun, Kar, G. S., Dhar, A., Kim, Doh-Y., Bhattacharya, D., Ray, S. K.

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

2003

Language:

english

File:

PDF, 689 KB

english, 2003

17

Effects of interfacial nitrogen on the structural and electrical properties of ultrathin ZrO[sub 2] gate dielectrics on partially strain-compensated SiGeC/Si heterolayers

Mahapatra, R., Maikap, S., Lee, Je-Hun, Kar, G. S., Dhar, A., Hwang, Nong-M., Kim, Doh-Y., Mathur, B. K., Ray, S. K.

Journal:

Applied Physics Letters

Year:

2003

Language:

english

File:

PDF, 251 KB

english, 2003

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